Semiconductor reliability test what

Semiconductor reliability testing mainly includes two categories: environmental testing and life testing.semiconductor testing Environmental testing includes mechanical testing (e.g., vibration testing, shock testing, centrifugal acceleration testing, etc.), lead wire solderability testing, temperature testing (low temperature, high temperature, and alternating temperature testing), and humidity/heat testing (constant humidity/heat and alternating humidity/heat).

Life tests focus on the long-term reliability of the device, including the high-temperature operating life (HTOL) test, which is used to determine the reliability of the device under high-temperature operating conditions and is usually conducted over a long period of time in accordance with the JESD22-A108 standard, and the high-temperature storage test,semiconductor failure analysis which is used to simulate the high-temperature environment that may be faced in long-term storage to assess its reliability.

In addition, there are special test programs such as Electrostatic Discharge (ESD) testing, where an electrostatic charge, which is a non-equilibrium charge at rest, creates an electric current when it moves, and can therefore damage or destroy gate oxides, metal layers,aotomatic prober and contacts. There are also high and low temperature tests, thermal resistance tests, mechanical shock tests, and lead bond strength tests.

Overall, there are numerous semiconductor reliability test items and various test methods, aiming at comprehensively assessing the performance and reliability of the devices in various environments and working conditions, so as to ensure their stable operation in practical applications.