Semi-Automatic Probe Stations:Making Sample Testing Easy to Master!

Introduction and Applications of Semi-Automatic/Full-Automatic Probe Stages

Semi-Automatic and Fully-Automatic Probe Stages offer a higher degree of automation. They automatically operate the probe arms and probes according to a preset program and position them on the object to be tested. The user only needs to enter commands to control the entire testing process. These platforms are also equipped with image recognition technology to automatically recognize the position of the object to be tested, improving the accuracy and efficiency of the test. Compared to manual probe station, semi-automatic and automatic probe stage systems are more efficient and convenient, saving significant labor and time costs and providing more reliable test results.

Probe Stage Applications:

Probe Stages are used to place electrical, optical or RF probes on silicon wafers to test chips or semiconductor devices in conjunction with test analyzers or semiconductor test management systems. These data test probe can be as simple as a connectivity or isolation check or as complex as a complete functional module test of a microcircuit. Tests we can be performed before or after wafers are cut into individual chip designs student. Wafer level as well as testing allows manufacturers to provide relevant information for determining the process operation steps needed to study the eventual enhancement of the product market by testing the chip devices themselves several times during production development. It also permits the manufacturer to perform social cost testing prior to chip packaging.

Classification of Fully and Semi-Automatic Probe Stations

Probe Stations can be categorized by type of use and function, as well as by mode of operation:Manual Probe Stations, Semi-Automatic Probe Stations and Fully Automated Probe Stations.

A manual probe stage system is a system that requires manual operation by the user. The user must physically control the movement of the wafer carrier stage, microscope and positioner/manipulator. Therefore, manual probe stages are primarily used for data measurement and acquisition without much test equipment. One of the advantages of the manual probe stage is that it requires very little training to configure the environment and convert the test environment without requiring additional training and setup time to operate the electronics, PC or software. Due to its flexibility and high malleability, it is ideal for researchers.

The fully automated semi-automated probe stage (MHU) and pattern recognition (auto-alignment) are relative to the two wafer material handling units mentioned above, and can perform the functions of wafer conveyance and positioning, ensuring that the grains on the wafer are sequentially contacted with the probes and tested one by one. The equipment can work continuously for 24 hours and is usually used for mass production of chips or processing of thin wafers, package substrates and other tasks with special requirements. Compared to manual/semi-automatic probe tables,micromanipulator fully automatic probe tables are much more expensive.